Web9 Jul 2007 · About KLA-Tencor: KLA-Tencor is the world leader in yield management and process control solutions for semiconductor manufacturing and related industries. Headquartered in San Jose, California, the company has sales and service offices around the world. An S&P 500 company, KLA-Tencor is traded on the NASDAQ Global Select … Web13 Jan 2015 · 4.1.1 The Tencor Profilometer may be used to measure film thickness and stress on a. variety of substrate sizes. The tip shank angle is 45º and the tip radius is 1.5-12.5. microns. 4.2 Stress Fixtures. 4.2.1 Stress fixtures for 4-inch and 6-inch wafers may be found near the Tencor. 5 SAFETY PRECAUTIONS. 5.1 Personal Safety Hazards
用于倾斜装置设计的计量目标设计【掌桥专利】
WebAutomated stylus profiler Specifications: Scan flatness: 20 nm over 0.5 mm scan 30 nm over 2 mm scan 40 nm over 30 mm scan 75 nm over 60 mm scan 170 nm over 130 mm scan Bow repeatability: 0.1% Stress repeatability: 2.5% Stage specifications: XY Stage repeatability: 2.0 µm (Static) and 2.5 µm (Dynamic) Z Stage: 65 mm Range optical … WebManufacturer: KLA-Tencor; Model: P-10; KLA Tencor P10 refurblished wafer size: 150mm – Sample size: up to 200mm – Low force head: 0.05 – 15mg – 0.05mg resolution – Step heigh repeatability, 0.001µm max. In the 13µm range; 0.005µm max in the 130µm rang... healthcare mentors
KLA TENCOR P-17 Metrology Moov Used Equipment
WebKLA Tencor P-16+ User Manual (456 pages) Profiler P1X / PX Brand: KLA Tencor Category: Laboratory Equipment Size: 27.27 MB Table of Contents Table of Contents 5 Chapter 1 Introduction & Safety 25 Instrument Overview 25 Safety 25 Introduction 25 Safety Symbols and Related Keywords 25 Lockout/Tagout Procedure 25 Stage and Head Movement … WebTencor P-2H Long Scan Surface Profiler with H2 Wafer Handler . Serial Number: 1292-0226 Refurbished and Calibrated with 180 Day parts and labor warranty Excellent condition Standard Sensor Assembly with new 12.5 Micron Stylus Tip and Optical Lamp -- Sold; Tencor Alpha-Step 200 Surface Profiler #3 - 1989 system ... WebThe KLA Tencor P-2 Long Scan Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure micro-roughness with 1 Angstrom resolution over short distances as well as waviness over a full, 210-mm (8.2-in.) Scan. healthcare menus